| dc.contributor.author | Jansen van Vuuren, Riekert | |
| dc.contributor.author | Botha, Gerhard | |
| dc.date.accessioned | 2020-04-20T07:20:24Z | |
| dc.date.available | 2020-04-20T07:20:24Z | |
| dc.date.issued | 2020 | |
| dc.identifier.citation | Jansen van Vuuren, R. & Botha, G. 2020. DC power quality emulator. International SAUPEC/RobMech/PRASA Conference, 29-32 Jan, Cape Town, South Africa #9040979. [https://doi.org/10.1109/SAUPEC/RobMech/PRASA48453.2020.9041079] | en_US |
| dc.identifier.isbn | 978-1-7281-4162-6 (Online) | |
| dc.identifier.uri | http://hdl.handle.net/10394/34562 | |
| dc.identifier.uri | https://ieeexplore.ieee.org/document/9041079 | |
| dc.identifier.uri | https://doi.org/10.1109/SAUPEC/RobMech/PRASA48453.2020.9041079 | |
| dc.description.abstract | Currently, no dc power quality standards exist. The lack of dc power quality (PQ) standards can be addressed by, amongst others, evaluating the impact of PQ deviations on consumer end equipment. A voltage disturbance emulation test source (VDETS) was designed that can be used to test the operation of dc equipment when subjected to different power quality disturbances. This paper provides a discussion on the design of the VDETS and the methods of emulating dc voltage dips (sags), voltage swells, ripple voltage, undervoltage, overvoltage and voltage interruptions. Basic testing of the VDETS is reported by means of voltage dip testing on two different dc light sources | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.subject | Power quality | en_US |
| dc.subject | DC | en_US |
| dc.subject | AC | en_US |
| dc.subject | Voltage disturbances | en_US |
| dc.subject | Emulator | en_US |
| dc.subject | Test source | en_US |
| dc.title | DC power quality emulator | en_US |
| dc.type | Presentation | en_US |
| dc.contributor.researchID | 27006034 - Jansen van Vuuren, Riekert | |
| dc.contributor.researchID | 22457380 - Botha, Mel Gerhard | |
